Probability of Hereditary Effects Due to Dose Radiation on X-Ray Radiography Examination

Introduction: This study estimates the risk of hereditary diseases related to X-ray radiation in conventional radiography, conducted at the Bali Academy of Radiodiagnostic and Radiotherapy Engineering using a Raysafe Multimeter. The focus is on stochastic radiation effects, including hereditary and cancerous impacts. These effects, which occur without a specific dose threshold, are linked to mutations in somatic and germinal cells that contribute to cancer and genetic disorders. The goal was to assess the hereditary risk by measuring radiation doses through the Entrance Surface Dose (ESD). Methods: Key variables measured during the radiographic procedure included output voltage (kV), exposure time (s), current output (mA), and radiation dose exposure (mGy). These measurements were used to calculate the ESD, which helped estimate hereditary risks for critical organs. Data collected with the Raysafe Multimeter was analyzed to establish the relationship between radiation dose and hereditary risk. Results: The study found that the lowest ESD value was 0.3737 mGy with 40 kV voltage, and the highest was 0.7328 mGy at 80 kV. It also showed that the first generation (Generation I) had a higher probability of hereditary effects than the second generation (Generation II). This was attributed to the cells' ability to repair radiation-induced damage over time, with the second generation benefiting from more opportunities for repair. Conclusion: The risk of hereditary diseases is influenced by the ESD and the cell’s repair ability. The second generation faces lower hereditary risk due to natural repair processes, underscoring the need for careful radiation exposure management in radiography.