A new double crystal calibration system for absolute x-ray emission measurements down to ∼1 keV energies

Over the past few years, work has been conducted at AWE to accurately characterize x-ray diffraction crystals to allow for absolute measurements of x-ray emission for our Orion opacity campaigns. Diffraction crystals are used in spectrometers on Orion to record the dispersed spectral features emitted by the laser produced plasma to obtain a measurement of the plasma conditions. Previously, based on a Manson x-ray source, our calibration system struggled to attain a high signal at the low energies required in calibration for the use of aluminum as a tracer for higher atomic number experiments. Here, we present data from the newly commissioned CTX400 x-ray source, a twin anode water cooled system, showing it to be a bright source even for ∼1 keV energies. Rocking curve measurements for three of the most commonly used crystals, namely, pentaerythritol, cesium acid phthalate, and germanium, are presented for both convex and flat forms.