Formation and Characterization of Mixed Copper Sulfide – Copper Telluride Layers on the Polyamide 6 Film Surface

By a study of IR and UV absorption spectra it is shown that the telluropentathionate anions are sorbed-diffused into thepolyamide 6 films if they are treated with the water solutions (0.01 mol⋅dm–3 − 0.1 mol⋅dm–3, 20 °C) of sodiumtelluropentathionate, Na2TeS4O6, or telluropentathionic acid, H2TeS4O6. The concentration of sorbed telluropentathionateions increases with the increase in duration of treatment and temperature of a TeS4O62– containing solution. Themixed copper sulfide – copper telluride, CuxS – CuyTe, layers are formed in the surface of polyamide 6 film if thechalcogenized polymer is treated with Cu(II/I) salt solution (10 min, 78 °C): the anionic particles TeS4O62– containingtellurium and sulfur atoms of low oxidation state react with the copper(II/I) ions. The conditions of a polymer initialchalcogenation determine the amount of copper and the composition of chalcogenide layer: the amount of copper in thechalcogenide layer increases with the increase of initial chalcogenation duration and the concentration of solution. Theresults of UV-VIS absorption spectra and X-ray structural analysis confirmed the formation of mixed copper sulfide –copper telluride layers in the surface of polyamide 6. The phase composition of layer changes depending on theconditions of the polymer initial treatment in a TeS4O62– solution. Three copper sulfide phases, Cu7S4, Cu1.9375S, Cu1.8S,and four copper telluride phases, Cu2Te, Cu3Te2, CuTe, Cu2.72Te2, were identified in the composition of the layers byX-ray diffraction. The regularities determined enable formation by sorption-diffusion method of electrically conductive(6.0⋅103 kΩ/ – 1.0 kΩ/) copper sulfide – copper telluride layers of desirable composition and conductivity using thesolutions of telluropentathionates as a polyamide 6 chalcogenation agents.