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Review of Shearography for Dual-Directional Measurement
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Shearography is a coherent optical technique that allows the identification of the first derivative of deformation in the shearing direction. Due to direct measuring strain information, shearography is suited for non-destructive testing and evaluation (NDT/NDE). However, if there is a small defect parallel to the shearing direction, the first derivative of deformation in the direction has no noticeable change, and the defect is not visible. Therefore, the development of a shearography system with dual-directional simultaneous measurement of the first derivatives of deformation both in x- and y-directions is highly demanded in the field of NDT/NDE. It is suited to inspect complicated defects, such as long and narrow slots, microcracks, etc. This paper presents a review of shearography for different dual-directional systems developed in the last two decades. After a brief overview of shearography, the paper will display two dual-directional shearographic techniques—temporal phase-shift (TPS) and spatial phase-shift (SPS) methods. TPS dual-shearing systems are suited for static measurements, while the SPS dual-shearing systems are useful for dynamic measurements. The basic theories, optical layouts, and comparisons are presented. The advantages and disadvantages of practical applications are discussed.
Title: Review of Shearography for Dual-Directional Measurement
Description:
Shearography is a coherent optical technique that allows the identification of the first derivative of deformation in the shearing direction.
Due to direct measuring strain information, shearography is suited for non-destructive testing and evaluation (NDT/NDE).
However, if there is a small defect parallel to the shearing direction, the first derivative of deformation in the direction has no noticeable change, and the defect is not visible.
Therefore, the development of a shearography system with dual-directional simultaneous measurement of the first derivatives of deformation both in x- and y-directions is highly demanded in the field of NDT/NDE.
It is suited to inspect complicated defects, such as long and narrow slots, microcracks, etc.
This paper presents a review of shearography for different dual-directional systems developed in the last two decades.
After a brief overview of shearography, the paper will display two dual-directional shearographic techniques—temporal phase-shift (TPS) and spatial phase-shift (SPS) methods.
TPS dual-shearing systems are suited for static measurements, while the SPS dual-shearing systems are useful for dynamic measurements.
The basic theories, optical layouts, and comparisons are presented.
The advantages and disadvantages of practical applications are discussed.
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