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Design of a Unified XOR Ring Oscillator PUF-TRNG Circuit in 45nm CMOS Technology
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In previous papers various True Random Number Generators (TRNG) and
Physically Unclonable Function (PUF) are discussed individually but only
a few of them include unified TRNG and PUF. TRNG’s are used in
cryptography and simulations for conditions in background noise that
impact the system. for a PUF its very unlikely to make another device
alike due to various intrinsic properties during manufacturing process.
PUF’s have various applications which include low-cost authentication,
secure key generation. In this work a new architecture of unified true
random number generator (TRNG) and physically unclonable function (PUF)
is introduced based on ring oscillators with high Uniqueness,
reliability, throughput, entropy. The main working of circuit is
dependent on two reference values Nij and Nref . The PUF response is
based on various intrinsic variables whereas TRNG’s randomness is based
on LSB of the Nij . With the current method, results and analysis
indicates increase in uniqueness, reliability and other parameters
compared to previous papers. The whole circuit is designed using 45nm
CMOS technology.
Institute of Electrical and Electronics Engineers (IEEE)
Title: Design of a Unified XOR Ring Oscillator PUF-TRNG Circuit in 45nm CMOS Technology
Description:
In previous papers various True Random Number Generators (TRNG) and
Physically Unclonable Function (PUF) are discussed individually but only
a few of them include unified TRNG and PUF.
TRNG’s are used in
cryptography and simulations for conditions in background noise that
impact the system.
for a PUF its very unlikely to make another device
alike due to various intrinsic properties during manufacturing process.
PUF’s have various applications which include low-cost authentication,
secure key generation.
In this work a new architecture of unified true
random number generator (TRNG) and physically unclonable function (PUF)
is introduced based on ring oscillators with high Uniqueness,
reliability, throughput, entropy.
The main working of circuit is
dependent on two reference values Nij and Nref .
The PUF response is
based on various intrinsic variables whereas TRNG’s randomness is based
on LSB of the Nij .
With the current method, results and analysis
indicates increase in uniqueness, reliability and other parameters
compared to previous papers.
The whole circuit is designed using 45nm
CMOS technology.
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