Optical Detectors

Title: Optical Detectors

Description:

Abstract The sections in this article are Introduction Devices for Light Detection Sensitivity and Detectivity of Light Detectors Responsivity Noise, Sensitivity, and Detectivity Light Detection Through Thermal Effects/Thermal Detectors Light Detection Using the Photoelectric Effect Phototube Photomultiplier Light Detection Using Internal Photoelectric Effects Photoconductor Photodiode PIN Photodiode Pinned Photodiode Avalanche Photodiode Metal–Semiconductor–Metal ( MSM ) Photodetectors Phototransistor Remarks on the Sensitivity of Semiconducting Light Detectors With and Without Internal Gain Mechanisms Noise of Semiconducting Photodetectors Dark Current Noise N yquist– J ohnson Noise Flicker Noise and 1/ f Noise Excess Noise Read Noise Image Detectors Pixel‐Based Image Detectors Pixel Number, Pixel Pitch and Nyquist Frequency Pixel Geometry and Spatial Pixel Response Image Acquisition Timing Charge‐Coupled Devices ( CCDs ) General Principle of CCD Operation Full Well Capacity and Blooming Charge Transfer and Electronic Shutter Capabilities Charge Readout Binning and Windowing Charge‐Transfer Efficiency ( CTE ) and Buried Channel CCD Multi‐Pinned Phase ( MPP ) Back Side Thinning and Back Illumination Etaloning at Long Wavelengths and Deep Depletion CCDs Photodiode Arrays ( PDAs ), Active Pixel Sensors ( APSs / CMOS ), and IR Focal Plane Arrays ( FPAs ) Plain Photodiode Arrays and Focal Plane Arrays CMOS Image Detectors/Active Pixel Sensors Double Sampling and Correlated Double Sampling ( CDS ) in APS Imagers Exposure Integration Schemes Electronic Shutter Modes Back‐Side Thinning of CMOS Image Detectors.