A new way of measuring the contribution of scattered photons to x‐ray fluorescence yields in secondary excitation mode

Abstract The characteristic K x‐rays from a secondary exciter in conjunction with an x‐ray tube or a radioisotope as primary source are frequently used for target excitation in x‐ray fluorescence measurements. In this experimental arrangement, the exciting photon spectrum consists of two parts: (i) characteristic K x‐rays of the secondary exciter and (ii) photons from the primary source, which are scattered from the secondary exciter. A new method is proposed for correcting the observed target x‐ray yield due to unwanted excitation by the scattered photons. This method involves measurement of x‐ray yield after replacing the secondary exciter by an equivalent exciter consisting of a low‐ Z element foil with a high‐ Z element backing. Copyright © 2004 John Wiley & Sons, Ltd.