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Properties of Basal-Plane-Faced Tilt Boundary Josephson Junction in YBCO Films
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We have investigated a Josephson junction formed at a boundary of an a-axis oriented plate surrounded by c-axis oriented grains. The YBCO c-axis oriented film with few a-axis oriented grains have been fabricated on a MgO(100) substrate by pulsed laser deposition. TEM observation shows clear lattice image along the grain boundary. Typical RSJ type I-V curves are observed with I
c
R
n of 1.37 mV and J
c of 4.4×104 A/cm2 at 4.2 K.
In addition, Shapiro steps under microwave irradiation and Fraunhofer-like diffraction pattern of I
c under magnetic field are observed, indicating that the boundary works as Josephson junction. Temperature dependence of the diffraction pattern under a magnetic field is different from one of conventional junctions which is described by penetration depth characteristics. This property is explained qualitatively on the basis of asymmetric electrodes structure.
Title: Properties of Basal-Plane-Faced Tilt Boundary Josephson Junction in YBCO Films
Description:
We have investigated a Josephson junction formed at a boundary of an a-axis oriented plate surrounded by c-axis oriented grains.
The YBCO c-axis oriented film with few a-axis oriented grains have been fabricated on a MgO(100) substrate by pulsed laser deposition.
TEM observation shows clear lattice image along the grain boundary.
Typical RSJ type I-V curves are observed with I
c
R
n of 1.
37 mV and J
c of 4.
4×104 A/cm2 at 4.
2 K.
In addition, Shapiro steps under microwave irradiation and Fraunhofer-like diffraction pattern of I
c under magnetic field are observed, indicating that the boundary works as Josephson junction.
Temperature dependence of the diffraction pattern under a magnetic field is different from one of conventional junctions which is described by penetration depth characteristics.
This property is explained qualitatively on the basis of asymmetric electrodes structure.
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