Automated Orientation and Diffraction Intensity (AODI) Mapping on a Curved Surface

A method for automated orientation and diffraction intensity (AODI) mapping on a curved surface has been established at the Shanghai Synchrotron Radiation Facility (SSRF). In our method, the curved surface of the sample is measured as the three-dimensional positional changes in the sample stage during scanning of the sample surface using a laser rangefinder. The diffraction intensity at each scanning point is measured with micro-beam Laue diffraction technology; after crystal orientation is automatically determined, the orientation and diffraction intensity are mapped on the curved surface of the sample. Our method has been applied in the measurement and representation of the crystal orientation of a nickel-based single-crystal turbine blade. An AODI mapping approach can locate orientation or misorientation changes directly on the curved surface of the single-crystal sample. Therefore, the developed AODI mapping strategy demonstrates a straightforward solution for a spatially resolved microstructure study of single-crystal workpieces, which would have an impact on their research and industrial applications.