Evaluation of current density measurement methods for high-current, low-beta electron beams

Recent current density measurements with a low-beta electron beam (β=0.5-0.75) are strongly affected by electron scatter and Cherenkov limits. These invasive measurements are heavily influenced by the electron energy and the intercepting material properties: density, index of refraction, and atomic number. We evaluate various measurement methods, including x-ray scintillation and Cherenkov emission. To optimize the x-ray scintillation technique for this energy regime, metal foils of differing atomic number (Z) and thickness were placed upstream of a scintillation screen. We have selected Cherenkov emitters, based on a material refractive index, in order to differentiate the contributions from electron scatter and produced fluorescence, Cherenkov emission, and total internal reflection. The observed distributions for both approaches are verified through MCNP6®. Additionally, the simulations provide insight as to what physical processes dominate the measured distribution. We conclude by determining the limits and optimal measurement range for each measurement technique.