Gear involute artifacts with sub-micron profile form deviations: manufacture and new design

Gear involute artifact (GIA) is a kind of calibration standard used for traceability of involute metrology. To machine GIAs with sub-micron profile form deviations, the effect on the involute profile deviations caused by the geometric deviations and 6-DoF errors of the machining tool based on the double roller-guide involute rolling generation mechanismwas analysed.At the same time, a double roller-guide involute lapping instrument and a lapping method for GIAs was proposed for lapping and in-situ measuring the gear involute artifacts. Moreover, a new GIA with three design base radii (50 mm, 100 mm, and 131 mm) was proposed for more efficient calibration and was machined with profile form deviations of 0.3 μm (within evaluation length of 38 mm, 68 mm, 80 mm, respectively, measured by the Chinese National Institute of Metrology), and the surface roughness Ra of the involute flanks was less than 0.05 μm. The research supports small-batch manufacturing for high-precision GIAs.