TESTING AND VERIFICATION IN VLSI

Testing and verification are essential stages of the VLSI design process, ensuring the correctness, reliability, and manufacturability of integrated circuits. This chapter presents a comprehensive overview of functional verification and manufacturing testing techniques used in modern VLSI systems. It discusses verification methodologies at different abstraction levels, including simulation-based verification, formal verification, and hardware description language (HDL)–based testbenches. The chapter also introduces design-for-testability (DFT) concepts such as scan chains, built-in self-test (BIST), and boundary scan, which improve fault coverage and reduce test complexity. Common fault models, test generation techniques, and post-silicon validation are examined to address defects arising from fabrication variations and process imperfections. By emphasizing both pre-silicon verification and post-silicon testing, this chapter highlights their critical role in reducing design errors, improving yield, and ensuring robust VLSI system performance.