Search engine for discovering works of Art, research articles, and books related to Art and Culture
ShareThis
Javascript must be enabled to continue!

Reactive Ion Etching of AlN, AlGaN, and GaN Using BCl3

View through CrossRef
ABSTRACTThe III-V nitrides are promising materials for use in UV-blue-green optoelectronics, high-temperature electronics, and negative-electron-affinity (NEA) electron emitter applications. In order to realize this potential, it is important to develop an etching technology for device fabrication. The stability of the III-V nitrides to harsh chemical environments makes most wet etching extremely difficult, so that dry etching alternatives are desirable. Recent experiments have shown that BCI3-based chemistries are effective for reactive ion etching of GaN and that KOH-based solutions may preferentially etch AIN from GaN. This paper reports on the use of BCI3 for etching AIN and AlGaN in addition to GaN and the creation of structures such as mesas and lines. It also examines the potential use of potassium Hydroxide (KOH) as a wet etchant of the nitrides. AIN, AlGaN, and GaN films grown by either metal-organic chemical vapor deposition (MOCVD) or molecular beam epitaxy (MBE) were patterned with Ni in 250 μm × 250 μm squares and 5 μm wide lines to create mesas and lines for typical light emitting diode (LED) or laser diode applications. Reactive ion etching was performed in a commercial reactor using BCI3 pressures ranging from 5 to 30 mTorr. Gas flow rates of 5 to 50 seem and RF powers of 50 to 150 W were employed. High nitride etch rates of up to 730 Å/min. were observed but lower etch rates were needed to avoid etching of the Ni mask. Smooth mesa surfaces and sidewalls were observed in scanning electron micrographs of the etched nitride structures. Mesas as small as 5 μm × 5 μm were patterned and made in this way. Lines were also made in a similar manner as narrow as 5 μm on GaN/AIN epilayers. Subsequent wet etching of these lines showed that KOH-based solutions such as AZ400K developer attack not only AIN but also GaN depending upon the quality of the film. Possibilities for using this wet etch as a defect etchant or selective etch of nitrides on SiC are discussed.
Title: Reactive Ion Etching of AlN, AlGaN, and GaN Using BCl3
Description:
ABSTRACTThe III-V nitrides are promising materials for use in UV-blue-green optoelectronics, high-temperature electronics, and negative-electron-affinity (NEA) electron emitter applications.
In order to realize this potential, it is important to develop an etching technology for device fabrication.
The stability of the III-V nitrides to harsh chemical environments makes most wet etching extremely difficult, so that dry etching alternatives are desirable.
Recent experiments have shown that BCI3-based chemistries are effective for reactive ion etching of GaN and that KOH-based solutions may preferentially etch AIN from GaN.
This paper reports on the use of BCI3 for etching AIN and AlGaN in addition to GaN and the creation of structures such as mesas and lines.
It also examines the potential use of potassium Hydroxide (KOH) as a wet etchant of the nitrides.
AIN, AlGaN, and GaN films grown by either metal-organic chemical vapor deposition (MOCVD) or molecular beam epitaxy (MBE) were patterned with Ni in 250 μm × 250 μm squares and 5 μm wide lines to create mesas and lines for typical light emitting diode (LED) or laser diode applications.
Reactive ion etching was performed in a commercial reactor using BCI3 pressures ranging from 5 to 30 mTorr.
Gas flow rates of 5 to 50 seem and RF powers of 50 to 150 W were employed.
High nitride etch rates of up to 730 Å/min.
were observed but lower etch rates were needed to avoid etching of the Ni mask.
Smooth mesa surfaces and sidewalls were observed in scanning electron micrographs of the etched nitride structures.
Mesas as small as 5 μm × 5 μm were patterned and made in this way.
Lines were also made in a similar manner as narrow as 5 μm on GaN/AIN epilayers.
Subsequent wet etching of these lines showed that KOH-based solutions such as AZ400K developer attack not only AIN but also GaN depending upon the quality of the film.
Possibilities for using this wet etch as a defect etchant or selective etch of nitrides on SiC are discussed.

Related Results

Highmobility AlGaN/GaN high electronic mobility transistors on GaN homo-substrates
Highmobility AlGaN/GaN high electronic mobility transistors on GaN homo-substrates
Gallium nitride (GaN) has great potential applications in high-power and high-frequency electrical devices due to its superior physical properties.High dislocation density of GaN g...
Studies on the Influences of i-GaN, n-GaN, p-GaN and InGaN Cap Layers in AlGaN/GaN High-Electron-Mobility Transistors
Studies on the Influences of i-GaN, n-GaN, p-GaN and InGaN Cap Layers in AlGaN/GaN High-Electron-Mobility Transistors
Systematic studies were performed on the influence of different cap layers of i-GaN, n-GaN, p-GaN and InGaN on AlGaN/GaN high-electron-mobility transistors (HEMTs) grown on sapphi...
Effects of GaN/AlGaN/Sputtered AlN nucleation layers on performance of GaN-based ultraviolet light-emitting diodes
Effects of GaN/AlGaN/Sputtered AlN nucleation layers on performance of GaN-based ultraviolet light-emitting diodes
AbstractWe report on the demonstration of GaN-based ultraviolet light-emitting diodes (UV LEDs) emitting at 375 nm grown on patterned sapphire substrate (PSS) with in-situ low temp...
Strain measurements at AlGaN/GaN HEMT structures on Silicon substrates
Strain measurements at AlGaN/GaN HEMT structures on Silicon substrates
High Electron Mobility Transistors (HEMTs) based on AlGaN/GaN are of great interest due to their high electrical performance and the related applications. The high carrier density,...
Carrier Localization at Atomic‐Scale Compositional Fluctuations in Single AlGaN Nanowires with Nano‐Cathodoluminescence
Carrier Localization at Atomic‐Scale Compositional Fluctuations in Single AlGaN Nanowires with Nano‐Cathodoluminescence
Considerable interest has been generated to develop highly efficient deep ultraviolet (DUV) emitters using AlGaN‐based alloys with direct bandgaps between 3.4 – 6.1 eV for a broad ...
High-temperature production of AlN in Mg alloys with ammonia gas
High-temperature production of AlN in Mg alloys with ammonia gas
Abstract The objective of this study was to produce composites with a uniform distribution of aluminum nitride (AlN) reinforcing particles in the magnesium (Mg) meta...
Data from Bcl3 Selectively Promotes Metastasis of ERBB2-Driven Mammary Tumors
Data from Bcl3 Selectively Promotes Metastasis of ERBB2-Driven Mammary Tumors
<div>Abstract<p>Bcl3 is a putative proto-oncogene deregulated in hematopoietic and solid tumors. Studies in cell lines suggest that its oncogenic effects are mediated t...
Data from Bcl3 Selectively Promotes Metastasis of ERBB2-Driven Mammary Tumors
Data from Bcl3 Selectively Promotes Metastasis of ERBB2-Driven Mammary Tumors
<div>Abstract<p>Bcl3 is a putative proto-oncogene deregulated in hematopoietic and solid tumors. Studies in cell lines suggest that its oncogenic effects are mediated t...

Back to Top