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Characterization of Epitaxial Films of Layered Materials Using Moiré Images of Scanning Tunneling Microscope
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Moiré-type modulated patterns have been observed in scanning tunneling microscope (STM) images of ultrathin epitaxial films of MoSe2 grown on MoS2 substrates, which arise from the existence of a very abrupt interface between two lattice-mismatched materials. Some distortions have been observed in the moiré patterns, reflecting the local lattice distortions in epitaxial films. It has been proven from a simple analysis that the moiré patterns enhance the distortions in the epitaxial films by a factor of 10 to 20, which enables the precise characterization of local lattice distortions in the epitaxial films.
Title: Characterization of Epitaxial Films of Layered Materials Using Moiré Images of Scanning Tunneling Microscope
Description:
Moiré-type modulated patterns have been observed in scanning tunneling microscope (STM) images of ultrathin epitaxial films of MoSe2 grown on MoS2 substrates, which arise from the existence of a very abrupt interface between two lattice-mismatched materials.
Some distortions have been observed in the moiré patterns, reflecting the local lattice distortions in epitaxial films.
It has been proven from a simple analysis that the moiré patterns enhance the distortions in the epitaxial films by a factor of 10 to 20, which enables the precise characterization of local lattice distortions in the epitaxial films.
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