Enhancement of phase retrieval accuracy by correcting transmission distance measurement error in the ptychography method based on clarity evaluation

Ensuring accurate phase-recovery accuracy in extended ptychography relies on precise measurement of the transmission distance between the sample and diffraction planes. This study proposes a novel method for determining the precise position of the diffraction surface based on the definition evaluation function. By accurately computing the distance between the sample surface and the diffraction surface, this method effectively mitigates phase reconstruction aberrations caused by the measurement error of transmission distances. Consequently, experimental validation was conducted to reconstruct the wavefront of an optical element. The results indicate the technology to be highly effective in suppressing the defocus phase error during the phase reconstruction process of extended ptychography, thereby enhancing the accuracy of phase retrieval.