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RHEED Intensity Monitored Growth of Bi-Sr-Ca-Cu-O Superconductors
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In order to fabricate Bi-Sr-Ca-Cu-O superconducting thin films, the molecular beam epitaxy (MBE) technique with in situ monitoring by reflection high-energy electron diffraction (RHEED) is used. By coevaporated growth of Bi2Sr2CaCu2O8 on LaAlO3 (100) substrates, RHEED intensity oscillation with a period corresponding to the growth of half a unit cell is observed. Out-of-phase oscillations are observed outside the specular spot. After the end of growth, a 10-minute RHEED intensity recovery at the specular spot is found. Possible mechanisms during and after growth are discussed.
Title: RHEED Intensity Monitored Growth of Bi-Sr-Ca-Cu-O Superconductors
Description:
In order to fabricate Bi-Sr-Ca-Cu-O superconducting thin films, the molecular beam epitaxy (MBE) technique with in situ monitoring by reflection high-energy electron diffraction (RHEED) is used.
By coevaporated growth of Bi2Sr2CaCu2O8 on LaAlO3 (100) substrates, RHEED intensity oscillation with a period corresponding to the growth of half a unit cell is observed.
Out-of-phase oscillations are observed outside the specular spot.
After the end of growth, a 10-minute RHEED intensity recovery at the specular spot is found.
Possible mechanisms during and after growth are discussed.
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Bruce Joyce was internationally renowned in chemistry, physics, materials science and electrical engineering. He is known for his pioneering work in epitaxy, the process during whi...