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A Highly Reliable Reconfigurable SRAM PUF Based on Error Correction Codes and Capacitor Preselection
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In recent years, researchers have extensively utilized the inherent
variations occurring during the manufacturing process of integrated
circuits to create physical unclonable functions (PUFs) as hardware
security primitives. However, traditional static entropy sources
employed in PUF applications exhibit certain drawbacks, including
limited availability of challengeresponse pairs (CRPs) and inadequate
randomness. Additionally, the reliability of PUFs is compromised due to
the impact of temperature and voltage fluctuations as well as aging
effects. To address these issues, this article presents a novel
architecture for PUFs based on Static Random Access Memory (SRAM) along
with a more suitable error-correcting code (ECC). Our approach enhances
the reliability of SRAM-based PUFs both internally, through capacitor
preselection, and externally, by employing ECC. The coding and decoding
process of the ECC is elaborated in detail. Furthermore, we analyze the
relevant parameters of the ECC and demonstrate that the combination of
these techniques results in a final bit error rate (BER
<0.1%). Through calculations, we validate that our
reconfigurable SRAM PUF can yield a larger number of CRPs. Experimental
results conducted on Xilinx Artix 7 demonstrate that the ECC we employ
achieves an ideal BER for PUFs, while simultaneously reducing hardware
overhead by 80%.
Title: A Highly Reliable Reconfigurable SRAM PUF Based on Error Correction Codes and Capacitor Preselection
Description:
In recent years, researchers have extensively utilized the inherent
variations occurring during the manufacturing process of integrated
circuits to create physical unclonable functions (PUFs) as hardware
security primitives.
However, traditional static entropy sources
employed in PUF applications exhibit certain drawbacks, including
limited availability of challengeresponse pairs (CRPs) and inadequate
randomness.
Additionally, the reliability of PUFs is compromised due to
the impact of temperature and voltage fluctuations as well as aging
effects.
To address these issues, this article presents a novel
architecture for PUFs based on Static Random Access Memory (SRAM) along
with a more suitable error-correcting code (ECC).
Our approach enhances
the reliability of SRAM-based PUFs both internally, through capacitor
preselection, and externally, by employing ECC.
The coding and decoding
process of the ECC is elaborated in detail.
Furthermore, we analyze the
relevant parameters of the ECC and demonstrate that the combination of
these techniques results in a final bit error rate (BER
<0.
1%).
Through calculations, we validate that our
reconfigurable SRAM PUF can yield a larger number of CRPs.
Experimental
results conducted on Xilinx Artix 7 demonstrate that the ECC we employ
achieves an ideal BER for PUFs, while simultaneously reducing hardware
overhead by 80%.
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