AFM Capabilities in Characterization of Particle Nanocomposites: From Angstroms to Microns

Scanning Probe Microscopy has been routinely employed as a surface characterization technique for nearly 20 years. Atomic Force Microscopy, the most widely used subset of SPM, can be performed in ambient conditions with minimum sample preparation. AFM is able to measure three-dimensional topography information from the angstrom level to the micron scale, with unprecedented resolution. This paper reviews the most common examples of nanoparticle composite evaluation with an AFM. AFM is well suited for dispersion strengthened composite characterization. A standard set of measured parameters includes: volume, In general, AFM nanocomposite characterization is both cost and time effective, as well as easier to use than electron microscopy. The resolution of AFM is greater than or comparable to SEM/TEM, and the strong advantages of AFM for nanoparticle composite characterization include morphology measurement along with direct measurements of height, volume and 3D display.