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Microscopy
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AbstractPrinciples, methods, and applications of light microscopy, electron microscopy, and scanning probe microscopy are described and complemented by related techniques such as ultrasound microscopy, field‐emission microscopy and X‐ray microscopy. Advanced methods such as Raman microscopy, low‐energy electron microscopy, and scanning near‐field microscopy representing new trends in the field of microscopy are discussed.
Title: Microscopy
Description:
AbstractPrinciples, methods, and applications of light microscopy, electron microscopy, and scanning probe microscopy are described and complemented by related techniques such as ultrasound microscopy, field‐emission microscopy and X‐ray microscopy.
Advanced methods such as Raman microscopy, low‐energy electron microscopy, and scanning near‐field microscopy representing new trends in the field of microscopy are discussed.
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Abstract
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