BiSrCaCuO/BiSrCuO S/N Heterostructure Grown by Halide Chemical Vapor Deposition

Thin-film S/N heterostructures of superconducting BiSrCaCuO and metallic BiSrCuO with good surface morphology, crystallinity, and superconducting properties were formed on (100) MgO substrates by halide chemical vapor deposition (CVD). Critical temperatures (T c at zero resistance) and critical current densities (J c) of the BiSrCaCuO films on MgO substrate were T c=75 to 80 K and J c=1×106 A/cm2 at 60 K. Resistivity of the metallic BiSrCuO films was 0.7 to 1.5×10-3 Ω·cm from 10 to 300 K. High-resolution transmission electron microscopy (HRTEM) images showed the interface between the BiSrCaCuO and BiSrCuO films to be atomically abrupt. The critical temperature of S/N multilayer samples was about 75 K.