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Magnetic Compton Profile Measurement of Thin Films
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We have measured magnetic Compton profile of Co/Pd thin films sputtered on a substrate for studying the electronic structure. For the first time, a silicon nitride substrate of 100 nm thickness we used in the magnetic Compton scattering experiment. We have improved vacuum tubes of the Compton beam-line BL08W of SPring-8, and have reduced greatly the background scattering for the Compton profile. We have succeeded in measuring magnetic Compton profile of Co (0.8 nm)/Pd (1.6 nm) 400 nm multilayer.
Trans Tech Publications, Ltd.
Title: Magnetic Compton Profile Measurement of Thin Films
Description:
We have measured magnetic Compton profile of Co/Pd thin films sputtered on a substrate for studying the electronic structure.
For the first time, a silicon nitride substrate of 100 nm thickness we used in the magnetic Compton scattering experiment.
We have improved vacuum tubes of the Compton beam-line BL08W of SPring-8, and have reduced greatly the background scattering for the Compton profile.
We have succeeded in measuring magnetic Compton profile of Co (0.
8 nm)/Pd (1.
6 nm) 400 nm multilayer.
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