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Optical Characterization of Graphene Oxide Films by Spectroscopic Ellipsometry
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The paper deals with the study of optical properties of graphene oxide (GO) by inkjet printing. Defined structure of GO can be obtained by reducing of prepared layers either by heating or by UV radiation (rGO). The dispersion function for refractive index and extinction coefficient of GO and both rGO thin films were measured by spectroscopic ellipsometry in the wavelength range of 200 – 850 nm. Spectroscopic ellipsometry (SE) was used characterize the optical response of layer of GO reduced by UV and thermal reduction GO in visible range.
Trans Tech Publications, Ltd.
Title: Optical Characterization of Graphene Oxide Films by Spectroscopic Ellipsometry
Description:
The paper deals with the study of optical properties of graphene oxide (GO) by inkjet printing.
Defined structure of GO can be obtained by reducing of prepared layers either by heating or by UV radiation (rGO).
The dispersion function for refractive index and extinction coefficient of GO and both rGO thin films were measured by spectroscopic ellipsometry in the wavelength range of 200 – 850 nm.
Spectroscopic ellipsometry (SE) was used characterize the optical response of layer of GO reduced by UV and thermal reduction GO in visible range.
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