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TOF‐SIMS imaging of polyester/melamine resin with bismuth cluster ions
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In recent years, secondary ion mass spectrometry (SIMS) with a time‐of‐flight (TOF) mass analyzer has been widely used for analyzing the structures of organic molecules. In particular, TOF‐SIMS with a cluster ion beam (Aun, Bin, C60, Arn, etc.) has been drawing attention as the technique can be used without destroying the structures of organic molecules. In this study, we imaged polyester/melamine resin using TOF‐SIMS with bismuth cluster ions. By secondary ion imaging, we confirmed that the melamine formaldehyde resin was concentrated on the surface of the paint film. By comparing the difference between C5H7N6+ (m/z = 151) and the other ions, we estimated that the degree of condensation of the melamine formaldehyde resin increased with a catalyst. Copyright © 2016 John Wiley & Sons, Ltd.
Title: TOF‐SIMS imaging of polyester/melamine resin with bismuth cluster ions
Description:
In recent years, secondary ion mass spectrometry (SIMS) with a time‐of‐flight (TOF) mass analyzer has been widely used for analyzing the structures of organic molecules.
In particular, TOF‐SIMS with a cluster ion beam (Aun, Bin, C60, Arn, etc.
) has been drawing attention as the technique can be used without destroying the structures of organic molecules.
In this study, we imaged polyester/melamine resin using TOF‐SIMS with bismuth cluster ions.
By secondary ion imaging, we confirmed that the melamine formaldehyde resin was concentrated on the surface of the paint film.
By comparing the difference between C5H7N6+ (m/z = 151) and the other ions, we estimated that the degree of condensation of the melamine formaldehyde resin increased with a catalyst.
Copyright © 2016 John Wiley & Sons, Ltd.
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