Flexible Electrochromic Organic Nanofilms (FEON) Applied in Civil Construction

Flexible Electrochromic Organic Nanofilms (FEON) have drawn intense attention due to their advantages over competing technologies. The method utilized to deposit as well as to integrate solutions and processed materials, manufacturing electrochromic organic nanofilms by the Electrodeposition System, has been presented in this research. The FEON device constructed in this work is electrochromic device are the base Poly (3,4-ethylenedioxythiophene), PEDOT:PSS, Poly(3-hexyl thiophene, P3HT, Phenyl-C61-butyric acid methyl ester, PCBM, Vanadium Pentoxide, V₂O₅, Lithium Perchlorate, LiClO4 in Propylene Carbonate, PC and Polyaniline-X1, PANI-X1, that were deposited in Indium Tin Oxide, ITO, and characterized by Electrical Measurements and Scanning Electron Microscopy (SEM). In addition, the thin film obtained by the deposition of PANI, prepared in perchloric acid solution, was identified through PANI-X1. The maximum process temperature was 50°C, which corresponds to the baking of the active polymeric layer. The result obtained by electrical Measurements has demonstrated that the PET/ ITO/PEDOT:PSS/P3HT:PCBM-Blend/V₂O₅/LiClO₄/ PANI-X1/ITO/PET layer presents the characteristic curve of standard electrochromic organic device after spin-coating and electrodeposition. The Thin film obtained by electrodeposition of PANI-X1 on ITO/PET Blend was prepared in perchloric acid solution. The spectrum absorption in the spectral region of 200-1100 nm of the flexible electrochromic organic nanofilm device indicated that the gradual increase of ddp of 0.0 Volt to 5.0 Volt generates a greater deviation in the optical spectral region between 450-850 nm. The thermal effects from ultraviolet irradiation under the device’s surface, in the irradiation simulator chamber, demonstrated a 5% reduction in the device’s lifetime. The inclusion of the PANI-X1 layer reduced the effects of degradation these electrochromic organic nanofilms induced for solar irradiation, a fact that also observed in the irradiation in the simulation chamber. In Scanning Electron Microscopy (SEM) these studies reveal that the surface of PANI-X1 layers is strongly conditioned by the surface morphology of the dielectric.