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Preparation and characterization of CdZnTe particle detectors

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Abstract CdZnTe detectors, as the most widely used X/γ ray detector in room temperature, has the advantages of high sensitivity, low noise, short pulse time and high detection efficiency. As the radiation category encountered in space environment is complex, research on the charged particle detection and particle discrimination capability of CdZnTe detector is conductive to expanding its application and providing solutions for special application scenarios in the space field. Therefore, this work mainly focused on the preparation of high resolution CdZnTe charge particle detectors. The main factors affecting charge particle detection resolution during the preparation of CdZnTe detectors were analyzed. The alpha/beta particle discrimination capability was verified using 241Am and 90Sr-90Y radiation sources. Alpha particles and beta particles can be distinguished through the rise time of the pulse waveform according to the different incident depth in CdZnTe detectors.
Title: Preparation and characterization of CdZnTe particle detectors
Description:
Abstract CdZnTe detectors, as the most widely used X/γ ray detector in room temperature, has the advantages of high sensitivity, low noise, short pulse time and high detection efficiency.
As the radiation category encountered in space environment is complex, research on the charged particle detection and particle discrimination capability of CdZnTe detector is conductive to expanding its application and providing solutions for special application scenarios in the space field.
Therefore, this work mainly focused on the preparation of high resolution CdZnTe charge particle detectors.
The main factors affecting charge particle detection resolution during the preparation of CdZnTe detectors were analyzed.
The alpha/beta particle discrimination capability was verified using 241Am and 90Sr-90Y radiation sources.
Alpha particles and beta particles can be distinguished through the rise time of the pulse waveform according to the different incident depth in CdZnTe detectors.

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