Quantitative analysis and optimization of X-ray Talbot effect wavefront sensing

Talbot wavefront sensing is essential for in-situ X-ray wavefront measurements. It can identify beam defects and provide fast feedback for precise correction and optical alignment in synchrotron radiation sources and X-ray free-electron lasers. Here, we quantitatively analyze and optimize Talbot wavefront sensing using scalar diffraction theory, which allows simulation of in-situ wavefront measurements for specific beamline optical layouts and prediction of wavefront results. Our approach enables precise modeling and accurate wavefront sensing prediction, helping optimize complex X-ray systems and improve overall beamline performance, thereby increasing the reliability and quality of experimental data and making more efficient use of limited resources at advanced X-ray facilities.