Single-Pixel Detecting of Rotating Object Using Zernike Illumination

In this paper, a single-pixel imaging technique based on Zernike illumination is firstly introduced to detect rotating object. By measuring the specific Zernike moments through a single-pixel detector, the rotation angle and angular rate of rotating object can be obtained. This method requires only 4 differential Zernike patterns to illuminate a rotating object in one frame. And the value of specific Zernike moment can be calculated from the corresponding reflected intensities collected by the single-pixel detector. Then the rotation angle and angular rate can be calculated from the phase change of specific Zernike moments due to the rotation invariant. By theoretical simulation and experimental demonstration, the Zernike moments of the targets are successfully obtained through single-pixel imaging system. The rotation angles are calculated from the measured Zernike moments and agree well with the actual rotation angles. The errors of simulated rotation angle are below 10 and the difference of measured rotation angle on experiment does not exceed 50. The proposed scheme provides a new method for rotating object detecting applications.