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Stick–slip behavior during electrowetting-on-dielectric: polarization and substrate effects
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Abstract
A novel triple-line stick–slip behavior, manifested by “sawtooth oscillations” of the contact angle (CA), was observed during sessile droplet advance by electrowetting-on-dielectric (EWOD) for DC voltages and during droplet retreat for AC voltages. The onset of stick–slip occurred on polished substrate surfaces when the applied potential approached the EWOD saturation voltage and at lower voltages on rougher surfaces. Stick–slip was reduced at higher AC frequencies (> 1 kHz), not significantly influenced by pH or voltage polarity and did not occur with AC polarization on substrates with a Parylene coating but no hydrophobic top-layer. The different triple-line pinning behaviors under DC and AC polarization are shown to be consistent with heterogeneous wetting associated with immobilization of charged species—referred to as charge trapping—near the triple-line at saturation. These experiments and insights offer a new approach for understanding and addressing EWOD device limitations related to CA saturation and charged species trapping leading to improved performance in micro-/nanofluidic pumps, digital microfluidic chips, and electret devices.
Graphical Abstract
Springer Science and Business Media LLC
Title: Stick–slip behavior during electrowetting-on-dielectric: polarization and substrate effects
Description:
Abstract
A novel triple-line stick–slip behavior, manifested by “sawtooth oscillations” of the contact angle (CA), was observed during sessile droplet advance by electrowetting-on-dielectric (EWOD) for DC voltages and during droplet retreat for AC voltages.
The onset of stick–slip occurred on polished substrate surfaces when the applied potential approached the EWOD saturation voltage and at lower voltages on rougher surfaces.
Stick–slip was reduced at higher AC frequencies (> 1 kHz), not significantly influenced by pH or voltage polarity and did not occur with AC polarization on substrates with a Parylene coating but no hydrophobic top-layer.
The different triple-line pinning behaviors under DC and AC polarization are shown to be consistent with heterogeneous wetting associated with immobilization of charged species—referred to as charge trapping—near the triple-line at saturation.
These experiments and insights offer a new approach for understanding and addressing EWOD device limitations related to CA saturation and charged species trapping leading to improved performance in micro-/nanofluidic pumps, digital microfluidic chips, and electret devices.
Graphical Abstract.
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